Development of a Low Frequency Noise Measurement Setup

Authors

  • Syed A. Malik
  • Asim. K. Ray

Keywords:

low-frequency noise measurement, 1/f noise, noise power spectral density

Abstract

Low-frequency noise measurement is a scientific technique which is capable of probing down to localized microscopic phenomena of electron devices. It can be used as a diagnostic tool in application concerning the reliability of electron devices. In this research, a low-frequency noise measurement (LFNM) setup to measure 1/f noise is designed, developed and validated. The measurement setup consists of a biasing circuit, a transimpedance amplifier and a dynamic signal analyzer. Two metal boxes were used to shield the setup from signal interference. A LabView-based program is developed to extract the noise power spectral density data from the dynamic signal analyzer for further analysis. Validation of the measurement setup was made by measuring the thermal noise of two standard resistors. The obtained results were similar to the theoretical values.

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Author Biographies

Syed A. Malik

Department of Physics, Faculty of Science and Technology, Universiti Pendidikan Sultan Idris, 35900 Tanjong Malim, Perak, Malaysia

Asim. K. Ray

Department of Physics, Faculty of Science and Technology, Universiti Pendidikan Sultan Idris, 35900 Tanjong Malim, Perak, Malaysia

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Published

2019-01-19

How to Cite

Malik, S. A., & Ray, A. K. (2019). Development of a Low Frequency Noise Measurement Setup. Journal of Science and Mathematics Letters, 3(1), 50–55. Retrieved from https://ojs.upsi.edu.my/index.php/JSML/article/view/383